Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices

Kaczer, BenBenKaczerFranco, JacopoJacopoFrancoTyaginov, S. E.S. E.TyaginovJech, M.M.JechRzepa, G.G.RzepaGrasser, T.T.GrasserO'Sullivan, BarryBarryO'SullivanRitzenthaler, RomainRomainRitzenthalerSchram, TomTomSchramSpessot, AlessioAlessioSpessotLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchi2021-10-242021-10-2420171071-1023https://imec-publications.be/handle/20.500.12860/28617Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devicesJournal articlehttp://avs.scitation.org/doi/full/10.1116/1.4972872