Kim, SoohyunSoohyunKimKim, JungchunJungchunKimJang, DoyoungDoyoungJangRitzenthaler, RomainRomainRitzenthalerParvais, BertrandBertrandParvaisMitard, JeromeJeromeMitardMertens, HansHansMertensChiarella, ThomasThomasChiarellaHoriguchi, NaotoNaotoHoriguchiLee, Jae WooJae WooLee2021-10-282021-10-2820202076-3417https://imec-publications.be/handle/20.500.12860/35390Comparison of temperature dependent carrier transport in FinFET and gate-all-Around nanowire FETJournal articlehttps://doi.org/10.3390/app10082979