Simultaneous atomic force microscope and quartz crystal microbalance measurements: interactions and displacement field of a quartz crystal microbalance

Friedt, Jean-MichelJean-MichelFriedtChoi, Kang-HoonKang-HoonChoiFrancis, LaurentLaurentFrancisCampitelli, AndrewAndrewCampitelli2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6335Simultaneous atomic force microscope and quartz crystal microbalance measurements: interactions and displacement field of a quartz crystal microbalanceJournal article