Border traps in Ge/III-V channel devices: Analysis and reliability aspects

Simoen, EddyEddySimoenLin, DennisDennisLinAlian, AliRezaAliRezaAlianBrammertz, GuyGuyBrammertzMerckling, ClementClementMercklingMitard, JeromeJeromeMitardClaeys, CorCorClaeys2021-10-212021-10-2120131530-4388https://imec-publications.be/handle/20.500.12860/23089Border traps in Ge/III-V channel devices: Analysis and reliability aspectsJournal article