Low-frequency drain current noise behavior of InP-based MODFET's in the linear and saturation regime

van Meer, HansHansvan MeerSimoen, EddyEddySimoenValenza, M.M.Valenzavan der Zanden, KoenKoenvan der ZandenDe Raedt, WalterWalterDe Raedt2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/3059Low-frequency drain current noise behavior of InP-based MODFET's in the linear and saturation regimeJournal article