Bock, KarlheinzKarlheinzBockKeppens, BartBartKeppensDe Heyn, VincentVincentDe HeynGroeseneken, GuidoGuidoGroesenekenChing, L. Y.L. Y.ChingNaem, AbdallaAbdallaNaem2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5074Influence of gate length on ESD-performance for deep submicron CMOS technologyJournal article