Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devices

Belmonte, AttilioAttilioBelmonteCelano, UmbertoUmbertoCelanoRedolfi, AugustoAugustoRedolfiFantini, AndreaAndreaFantiniMuller, RobertRobertMullerVandervorst, WilfriedWilfriedVandervorstHoussa, MichelMichelHoussaJurczak, GosiaGosiaJurczakGoux, LudovicLudovicGoux2021-10-222021-10-2220150018-9383https://imec-publications.be/handle/20.500.12860/24978Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devicesJournal articlehttp://ieeexplore.ieee.org/document/7103322/?arnumber=7103322