Roldan, J. B.J. B.RoldanMaldonado, D.D.MaldonadoJimenez-Molinos, F.F.Jimenez-MolinosAcal, C.C.AcalRuiz-Castro, J. E.J. E.Ruiz-CastroAguilera, A. M.A. M.AguileraHui, F.F.HuiKong, J.J.KongJing, X.X.JingWed, C.C.WedVillena, M. A.M. A.VillenaLanza, M.M.LanzaShi, YuanyuanYuanyuanShi2021-11-242021-11-022021-11-2420201541-7026WOS:000612717200102https://imec-publications.be/handle/20.500.12860/38228Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltagesProceedings paper978-1-7281-3199-3WOS:000612717200102