Hot-carrier induced degradation of Ge/STI interfaces in Ge-on-Si junction devices

Musibau, SolomonSolomonMusibauFranco, JacopoJacopoFrancoTsiara, ArtemisiaArtemisiaTsiaraDe Wolf, IngridIngridDe WolfCroes, KristofKristofCroes2024-08-062024-03-182024-08-0620240038-1101WOS:001181854500001https://imec-publications.be/handle/20.500.12860/43700Hot-carrier induced degradation of Ge/STI interfaces in Ge-on-Si junction devicesJournal article10.1016/j.sse.2024.108867WOS:001181854500001