Baklanov, MikhaïlMikhaïlBaklanovMogilnikov, K. P.K. P.MogilnikovPolovinkin, V. G.V. G.PolovinkinDultsev, F. N.F. N.Dultsev2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4091Determination of pore size distribution in thin films by ellipsometric posimetryJournal article