Mouthaan, T.T.MouthaanPetrescu, VioletaVioletaPetrescuSchoenmaker, WimWimSchoenmakerGroot, F.F.GrootAngelecu, S.S.AngelecuNiehof, J.J.NiehofProfirescu, M. D.M. D.Profirescu2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/783Early resistance change modelling in electromigrationProceedings paper