Diamond tips for electrical AFM measurements with sub-nanometer resolution

Hantschel, ThomasThomasHantschelTsigkourakos, MenelaosMenelaosTsigkourakosParedis, KristofKristofParedisEyben, PierrePierreEybenNuytten, ThomasThomasNuyttenSchulze, AndreasAndreasSchulzeVandervorst, WilfriedWilfriedVandervorst2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23906Diamond tips for electrical AFM measurements with sub-nanometer resolutionMeeting abstract