On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements

Scandurra, GraziellaGraziellaScandurraBeyne, SofieSofieBeyneGiusi, GinoGinoGiusiCiofi, CarmineCarmineCiofi2021-10-272021-10-2720190860-8229https://imec-publications.be/handle/20.500.12860/33944On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurementsJournal articlehttp://www.czasopisma.pan.pl/Content/110249/PDF/art_02.pdf