Radiation damage in deep submicron MOSFETs by high-temperature electron irradiation

Hayama, K.K.HayamaOhyama, H.H.OhyamaTakakura, K.K.TakakuraSimoen, EddyEddySimoenPoyai, AmpornAmpornPoyaiClaeys, CorCorClaeys2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6377Radiation damage in deep submicron MOSFETs by high-temperature electron irradiationOral presentation