Ohyama, H.H.OhyamaTakakura, K.K.TakakuraShigaki, K.K.ShigakiKuboyama, S.S.KuboyamaMatsuda, S.S.MatsudaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7946Radiation damage of Si photodiodes by high-temperature irradiationJournal article