Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

Kukner, HalilHalilKuknerKhan, SeyabSeyabKhanWeckx, PieterPieterWeckxRaghavan, PraveenPraveenRaghavanHamdioui, SaidSaidHamdiouiKaczer, BenBenKaczerCatthoor, FranckyFranckyCatthoorVan der Perre, LiesbetLiesbetVan der PerreLauwereins, RudyRudyLauwereinsGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-2220141530-4388https://imec-publications.be/handle/20.500.12860/24073Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gatesJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6529142&queryText%3DComparison+of+reaction-diffusion+and+atomisti