Interconnect test for 3D stacked memory-on-logic

Taouil, MottaqiallahMottaqiallahTaouilMasadeh, MahmoudMahmoudMasadehHamdioui, SaidSaidHamdiouiMarinissen, Erik JanErik JanMarinissen2021-10-222021-10-222014-03https://imec-publications.be/handle/20.500.12860/24603Interconnect test for 3D stacked memory-on-logicProceedings paperhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6800340&tag=1tp=&arnumber=6800340