Defect-based methodology for workload-dependent circuit lifetime projections

Weckx, PieterPieterWeckxKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueGrasser, TiborTiborGrasserRoussel, PhilippePhilippeRousselKukner, HalilHalilKuknerRaghavan, PraveenPraveenRaghavanCatthoor, FranckyFranckyCatthoorGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/23385Defect-based methodology for workload-dependent circuit lifetime projections – application to SRAMProceedings paper