Ruttens, GerlindeGerlindeRuttensQu, X. P.X. P.QuZhu, S. Y.S. Y.ZhuLi, Bing-ZongBing-ZongLiDetavernier, C.C.DetavernierVan Meirhaeghe, R. L.R. L.Van MeirhaegheCardon, F.F.CardonDonaton, R. A.R. A.DonatonMaex, KarenKarenMaex2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4711Ion-bombardment effects on PtSi/n-Si Schottky contacts studied by ballistic electron emission microscopyJournal article