Tallarico, AndreaAndreaTallaricoPosthuma, NielsNielsPosthumaBakeroot, BenoitBenoitBakerootDecoutere, StefaanStefaanDecoutereSangiorgi, EESangiorgiFiegna, CCFiegna2021-10-292021-10-2920200026-2714https://imec-publications.be/handle/20.500.12860/36047Role of the AlGaN barrier on the long-term gate reliability of power HEMTsJournal articlehttps://doi.org/10.1016/j.microrel.2020.113872