Zhang, Cher XuanCher XuanZhangZhang, E. XiaE. XiaZhangFleetwood, Dan M.Dan M.FleetwoodSchrimpf, Ronald DRonald DSchrimpfGalloway, Kenneth F.Kenneth F.GallowaySimoen, EddyEddySimoenMitard, JeromeJeromeMitardClaeys, CorCorClaeys2021-10-192021-10-192010https://imec-publications.be/handle/20.500.12860/18409Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETsProceedings paper