Avoiding parasitic current flow through point contacts in test structures for QSSPC contact recombination current measurements

Deckers, JanJanDeckersDebucquoy, MaartenMaartenDebucquoyGordon, IvanIvanGordonMertens, RobertRobertMertensPoortmans, JefJefPoortmans2021-10-222021-10-2220152156-3381https://imec-publications.be/handle/20.500.12860/25168Avoiding parasitic current flow through point contacts in test structures for QSSPC contact recombination current measurementsJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=6917004