Correlation between the low-frequency noise spectral density and the static device parameters of silicon-on-insulator MOSFET's

Simoen, EddyEddySimoenClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/869Correlation between the low-frequency noise spectral density and the static device parameters of silicon-on-insulator MOSFET'sJournal article