Gupta, NehaNehaGuptaAcharya, Lomash ChandraLomash ChandraAcharyaSingh, Khoirom JohnsonKhoirom JohnsonSinghDargupally, MahipalMahipalDargupallyMishra, NeerajNeerajMishraSharma, ArvindArvindSharmaMondal, AjoyAjoyMondalRamakrishnan, VenkatramanVenkatramanRamakrishnanDasgupta, SudebSudebDasguptaBulusu, AnandAnandBulusu2026-09-142026-09-1420262168-2356https://imec-publications.be/handle/20.500.12860/60344Editor’s notes: The article introduces a variation-aware timing model, emphasizing aging, for the INV-Tx structure. By reducing aging-induced degradation in a thermometer encoder, this method can eliminate the need for errordetection circuits in data converters, ensuring accurate digital encoding. —Hemangee K. Kapoor, IIT Guwahati, IndiaengAging-Aware Timing Models for Reliability Enhancement of Inverter-Transmission Gate-Based CircuitsJournal article10.1109/mdat.2026.3677138WOS:0017728772000052168-2364