Radiation damage of N-MOSFETS fabricated in a BiCMOS process

Kobayashi, K.K.KobayashiOhyama, HidenoriHidenoriOhyamaYoneoka, M.M.YoneokaHayama, KiyoteruKiyoteruHayamaNakabayashi, M.M.NakabayashiSimoen, EddyEddySimoenClaeys, CorCorClaeysTakami., Y.Y.Takami.Takizawa, H.H.TakizawaKohiki, S.S.Kohiki2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5405Radiation damage of N-MOSFETS fabricated in a BiCMOS processJournal article