Marcon, DenisDenisMarconMeneghesso, GaudenzioGaudenzioMeneghessoWu, Tian-LiTian-LiWuStoffels, SteveSteveStoffelsMeneghini, MatteoMatteoMeneghiniZanoni, EnricoEnricoZanoniDecoutere, StefaanStefaanDecoutere2021-10-212021-10-2120130018-9383https://imec-publications.be/handle/20.500.12860/22760Reliability analysis of permanent degradations on AlGaN/GaN HEMTsJournal article