Drobnŭ, JakubJakubDrobnŭMarek, JurajJurajMarekKoza, A.A.KozaVadovski, J.J.VadovskiGeens, KarenKarenGeensBorga, MatteoMatteoBorgaLiang, HuHuLiangYou, ShuzhenShuzhenYouDecoutere, StefaanStefaanDecoutereStuchlíková, LubicaLubicaStuchlíková2021-10-282021-10-282020https://imec-publications.be/handle/20.500.12860/35072DLTS Study of Electrically Active Defects in semi-vertical GaN-on-Si FETsProceedings paper