On the relationship between the bulk recombination lifetime and the excess 1/f noise in silicon p-n junction diodes

Simoen, EddyEddySimoenVanhellemont, JanJanVanhellemontClaeys, CorCorClaeys2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1496On the relationship between the bulk recombination lifetime and the excess 1/f noise in silicon p-n junction diodesJournal article