Hantschel, ThomasThomasHantschelClarysse, TrudoTrudoClarysseNuytten, ThomasThomasNuyttenParedis, KristofKristofParedisEyben, PierrePierreEybenVandervorst, WilfriedWilfriedVandervorst2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22459Diamond nanoprobes for electrical probing of nanoelectronics device structuresMeeting abstract