Ohyama, H.H.OhyamaHayama, K.K.HayamaTakakura, K.K.TakakuraSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6655Effects of irradiation temperature on radiation damage in electron-irradiated MOSFETsOral presentation