Kraak, DanielDanielKraakAgbo, InnocentInnocentAgboTaouil, MottaMottaTaouilHamdioui, SaidSaidHamdiouiWeckx, PieterPieterWeckxCosemans, StefanStefanCosemansCatthoor, FranckyFranckyCatthoor2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/31082Degradation analysis of high performance 14nm FinFET SRAMProceedings paper