Implications of BTI-induced time-dependent statistics on yield estimation of digital circuits

Weckx, PieterPieterWeckxKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueRaghavan, PraveenPraveenRaghavanFranco, JacopoJacopoFrancoRoussel, PhilippePhilippeRousselGroeseneken, GuidoGuidoGroesenekenCatthoor, FranckyFranckyCatthoor2021-10-222021-10-2220140018-9383https://imec-publications.be/handle/20.500.12860/24809Implications of BTI-induced time-dependent statistics on yield estimation of digital circuitsJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6719591