Wu, WenWenWuErnur, DidemDidemErnurBrongersma, SywertSywertBrongersmaVan Hove, MarleenMarleenVan HoveMaex, KarenKarenMaex2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9939Grain growth in copper interconnect linesJournal article