Fast ramped voltage characterization of single trap bias and temperature impact on time-dependent VTH variability

Toledano Luque, MariaMariaToledano LuqueDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselRagnarsson, Lars-AkeLars-AkeRagnarssonChiarella, ThomasThomasChiarellaHoriguchi, NaotoNaotoHoriguchiMocuta, AndaAndaMocutaThean, AaronAaronThean2021-10-222021-10-222014-090018-9383https://imec-publications.be/handle/20.500.12860/24616Fast ramped voltage characterization of single trap bias and temperature impact on time-dependent VTH variabilityJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6870474