Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs

Li, KanKanLiZhang, EnxiaEnxiaZhangGorchichko, MariiaMariiaGorchichkoWang, PengfeiPengfeiWangHiblot, GaspardGaspardHiblotJourdain, AnneAnneJourdainVan Huylenbroeck, StefaanStefaanVan HuylenbroeckReed, RobertRobertReedFleetwood, DanielDanielFleetwoodSchrimpf, RonaldRonaldSchrimpf2021-10-282021-10-282020https://imec-publications.be/handle/20.500.12860/35465Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETsProceedings paperhttp://www.nsrec.com/2020_session-c.html