Groeseneken, GuidoGuidoGroesenekenKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueFranco, JacopoJacopoFrancoRoussel, PhilippePhilippeRoussel2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20753The future of CMOS device reliability assessment: from individual traps to circuit simulationsOral presentation