Vanthienen, Pieter-JanPieter-JanVanthienenFrancken, Nicholas F.Nicholas F.FranckenSanctorum, JonathanJonathanSanctorumSijbers, JanJanSijbersDe Beenhouwer, JanJanDe Beenhouwer2025-05-112025-05-112025-APR 21094-4087WOS:001478844400003https://imec-publications.be/handle/20.500.12860/45638Gratings for multi-resolution edge illumination X-ray phase contrast imaging: concept and simulationJournal article10.1364/OE.550252WOS:001478844400003