Influence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devices

Ahmad, TareqTareqAhmadDevulder, WouterWouterDevulderOpsomer, KarlKarlOpsomerMinjauw, MatthiasMatthiasMinjauwCelano, UmbertoUmbertoCelanoHantschel, ThomasThomasHantschelVandervorst, WilfriedWilfriedVandervorstGoux, LudovicLudovicGouxKar, Gouri SankarGouri SankarKarDetavernier, ChristopheChristopheDetavernier2021-10-252021-10-2520181944-8244https://imec-publications.be/handle/20.500.12860/30088Influence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devicesJournal articlehttps://pubs.acs.org/doi/abs/10.1021/acsami.7b18228