Ku, Bon WoongBon WoongKuDebacker, PeterPeterDebackerMilojevic, DragomirDragomirMilojevicRaghavan, PraveenPraveenRaghavanVerkest, DiederikDiederikVerkestThean, AaronAaronTheanLim, Sung KyuSung KyuLim2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26853Physical design solutions to tackle FEOL/BEOL degradation in gate-level monolithic 3D ICsProceedings paperhttp://dl.acm.org/citation.cfm?id=2934622