Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of Transistors

Kocak, Husnu MuratHusnu MuratKocakMitard, JeromeJeromeMitardNaskali, Ahmet TeomanAhmet TeomanNaskali2023-04-262022-12-012023-04-2620221071-9032WOS:000886161200004https://imec-publications.be/handle/20.500.12860/40811Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of TransistorsProceedings paper10.1109/ICMTS50340.2022.9898251978-1-6654-8566-1WOS:000886161200004DEFECT PATTERNS