Francis, S.A.S.A.FrancisZhang, Cher XuanCher XuanZhangZhang, En XiaEn XiaZhangFleetwood, Daniel M.Daniel M.FleetwoodSchrimpf, Ronald D.Ronald D.SchrimpfGolloway, Kenneth F.Kenneth F.GollowaySimoen, EddyEddySimoenMitard, JeromeJeromeMitardClaeys, CorCorClaeys2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18923Comparison of charge pumping and 1/f noise in irradiated Ge pMOSFETsProceedings paper