Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy

Op de Beeck, JonathanJonathanOp de BeeckFleischmann, ClaudiaClaudiaFleischmannParedis, KristofKristofParedisvan der Heide, PaulPaulvan der HeideVandervorst, WilfriedWilfriedVandervorstGeiser, BrianBrianGeiserBunton, JoeJoeBuntonUlfig, RobertRobertUlfigLarson, DaveDaveLarson2021-10-292021-10-292020https://imec-publications.be/handle/20.500.12860/35677Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopyMeeting abstracthttps://www.atomprobe.com/-/media/ametekatomprobe/files/news-and-events/pdf/aptmprogrammedraft201109.pdf?dmc=1&la=en&revision=ab8adfd1-ecf4-4afa-b90e-80f8a254534f&hash=028E619DEA1AFCAABF7B724B28D040D6