A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays

Kim, WoojinWoojinKimPica, ValerioValerioPicaJossart, NicoNicoJossartYasin, FarrukhFarrukhYasinWostyn, KurtKurtWostynCouet, SebastienSebastienCouetRao, SiddharthSiddharthRao2024-11-142024-07-122024-11-1420242330-7978WOS:001233896700014https://imec-publications.be/handle/20.500.12860/44150A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arraysProceedings paper10.1109/IMW59701.2024.10536950979-8-3503-0652-1WOS:001233896700014