Aoulaiche, MarcMarcAoulaicheCollaert, NadineNadineCollaertDegraeve, RobinRobinDegraeveLu, ZhichaoZhichaoLuDe Wachter, BartBartDe WachterJurczak, GosiaGosiaJurczakAltimime, LaithLaithAltimime2021-10-182021-10-1820100741-3106https://imec-publications.be/handle/20.500.12860/16656BJT mode endurance on a 1T-RAM bulk FinFET deviceJournal article