Improvements of NBTI Reliability in SiGe p-FETs

Franco, JacopoJacopoFrancoKaczer, BenBenKaczerCho, Moon JuMoon JuChoEneman, GeertGeertEnemanGroeseneken, GuidoGuidoGroesenekenGrasser, TiborTiborGrasser2021-10-182021-10-182010-05https://imec-publications.be/handle/20.500.12860/17113Improvements of NBTI Reliability in SiGe p-FETsProceedings paper