A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS

Parvais, BertrandBertrandParvaisWambacq, PietPietWambacqMercha, AbdelkarimAbdelkarimMerchaVerkest, DiederikDiederikVerkestThean, AaronAaronTheanHammo, HiroakiHiroakiHammoOishi, TetsuyaTetsuyaOishiSawada, KenKenSawadaNomoto, KazukiKazukiNomoto2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25739A digital intensive circuit for low-frequency noise monitoring in 28nm CMOSProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7387446