Kilchytska, V.V.KilchytskaAlvarado, J.J.AlvaradoCollaert, NadineNadineCollaertRooyackers, RitaRitaRooyackersPut, SofieSofiePutSimoen, EddyEddySimoenClaeys, CorCorClaeysFlandre, D.D.Flandre2021-10-192021-10-1920110038-1101https://imec-publications.be/handle/20.500.12860/19174Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETsJournal article