Yu, HaoHaoYuParvais, BertrandBertrandParvaisPeralagu, UthayasankaranUthayasankaranPeralaguElKashlan, Rana Y.Rana Y.ElKashlanRodriguez, RaulRaulRodriguezKhaled, AhmadAhmadKhaledYadav, SachinSachinYadavAlian, AliRezaAliRezaAlianZhao, MingMingZhaoBraga, N. de AlmeidaN. de AlmeidaBragaCobb, J.J.CobbFang, J.J.FangCardinael, PieterPieterCardinaelSibaja-Hernandez, ArturoArturoSibaja-HernandezCollaert, NadineNadineCollaert2023-06-162023-05-252023-05-312023-06-162022-12-012380-9248WOS:000968800700145https://imec-publications.be/handle/20.500.12860/41628Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and SolutionsProceedings paper10.1109/IEDM45625.2022.10019489978-1-6654-8959-1WOS:000968800700145