Nanoscale electrical characterization of CuTCNQ layers by conductive AFM in view of their use as resistive random access memory (RRAM)

Deleruyelle, DamienDamienDeleruyelleThomas, MarylineMarylineThomasMuller, ChristopheChristopheMullerMuller, RobertRobertMullerGoux, LudovicLudovicGouxWouters, DirkDirkWoutersKever, ThorstenThorstenKeverBoettger, UlrichUlrichBoettgerWaser, RainerRainerWaser2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15218Nanoscale electrical characterization of CuTCNQ layers by conductive AFM in view of their use as resistive random access memory (RRAM)Oral presentation