Simoen, EddyEddySimoenClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/871Erratum : "Substrate bias effect on the capture kinetics of random telegraph signals in submicron p-channel silicon metal-oxide-semiconductor transistors" [Appl. Phys. Lett. 66, 598 (1995)]Journal article